37 Lifecycle Management of Independent Protection Layers

Tuesday, March 15, 2011: 8:00 AM
Columbus EF (Hyatt Regency Chicago)
Description:
In 2001, the CCPS published “Layer of Protection Analysis: Simplified Process Risk Assessment”. After nearly a decade of use, Layer of Protection Analysis (LOPA) has become widely accepted and is now used in a variety of industries. As a result of the pervasive application of LOPA, there has been a proliferation of recommendations and a clearly defined need to sustain the probability of failure on demand (PFD) values that are claimed for Independent Protection Layers (IPLs) in the LOPA studies. Consequently, the industry has experienced challenges and new advancements in the ways IPL’s are managed through their lifecycle, from initial evaluation and selection of IPLs, to the ongoing inspection, testing, and maintenance, and eventual decommissioning. This session welcomes papers related to lifecycle management of Independent Protection Layers, with a particular emphasis on case studies and learning opportunities.

Sponsor:
26th Center for Chemical Process Safety International Conference (CCPS)

Chair:
Robert F. Wasileski III
Email: wasiler@novachem.com

Co-Chair:
Jeff Fox
Email: jeff.fox@dowcorning.com

- indicates paper has an Extended Abstract file available on CD.

File available
8:00 AM
(37a) Can Functional Testing Be Replaced by Inspection After Demands?
Hui Jin, Mary Ann Lundteigen and Marvin Rausand
See more of this Group/Topical: Topical 1: Global Congress on Process Safety