Wednesday, 26 April 2006: 8:00 AM-11:15 AM
North Hemisphere Salon E4 (Dolphin Hotel)

Topical 3: 2006 Process Plant Safety Symposium (T3)

#190 - Safety Instrumented Systems and Safety Critical Devices (T3000)
The proper application of Safety Instrumented Systems (SIS) is obviously important for process plants. However, non-SIS Safety Critical Systems (e.g., Safety Critical Devices) also play an important role. This session invites papers in the areas of:· Safety Instrumented Systems - SIS design, SIL level determination, identification of IPLs, probability calculations, application of LOPA to SIS, etc.· Safety Critical Devices (SCDs) - Examples, opportunities to apply SCDs instead of SIS, management of SCDs, application of LOPA to SCDs, etc.
Chair:Harry West
CoChair:Angela Summers
8:00 AMRisk Abatement Provided by Safety Instrumented Systems May Cause Remote Hazards with Higher Risks
Adrian Sepeda
8:30 AMFailure Conundrum
Michela Gentile, Angela Summers
9:00 AMUsing Layer of Protection Analysis to Define Safety Integrity Level Requirements
Randy Freeman
9:30 AMBreak
10:15 AMUse of Layer of Protection Analysis (Lopa) to Determine Protective System Requirements
W. Kent Goddard
10:45 AMAsset Protection, Applying Safety Life Cycle Methods
William H. Johnson, Richard R. Dunn, Stanley A. Urbanik, Victor J. Maggioli
11:15 AMPanel Discussion - Safety Instrumented Systems and Safety Critical Devices
Harry West

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