Monday, 24 April 2006: 8:00 AM-11:00 AM
South Hemisphere Salon 2 (Dolphin Hotel)

Topical 2: Ethylene Producers Conference (T2)

#22 - Ethylene Plant Process Control (T2004)
Applications-oriented papers pertaining to the control and optimization of olefins plants. Papers on industrial use of novel analytics, instrumentation, systems technologies, and realtime monitoring/fault detection applications are covered. The theme for the 2006 session is Assuring Full Utilization of APC (Advanced Process Control) and RTO (Real Time Optimization) Applications.
Chair:Don Bartusiak
CoChair:James Hackney
8:00 AMIntroduction - Opening Remarks
Don Bartusiak
8:05 AMAdvantages of "Grey Box" Multivariable Predictive Control for Ethylene Plants
Bram De Ruiter
8:30 AMBuilding an Effective Operator Interface for Complex Apc Applications
Erin S. Percell, Louis M. Michaud
8:55 AMA New Paradigm for Process Operator Training and Guidance
James Wu, John Mahlstadt, Gene Thompson, Charles Cutler, Matthew Hetzel, James Bonura
9:20 AMBreak
9:35 AMA Dmcplus Tale of Two C3 Splitters
Jose Basteris, Pieter Couwenberg, Hugh O'Riordan, Jose Maria Martinez
10:00 AMStep-Test Free Apc Implementation Using Dynamic Simulation
Nicholas Alsop, JoseMaria Ferrer
10:25 AMUse of External Targets to Improve Dmcplus Controller Performance and Long-Term Benefits
Sjaak Mechielsen, Mauro Celendano, Doug Amos, Jose Basteris
10:50 AMConcluding Remarks

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