463241 In-Situ X-Ray Diffraction Studies on the Self-Assembly of Metal Halide Perovskite Thin Films
Understanding the nucleation and growth processes of the MHP thin films is a prerequisite for scale up of the device area, improvement in reliability and further increase in efficiency. Here we present our results on synchrotron based in-situ grazing incidence X-ray scattering studies on the MHP thin film formation processes. Our results reveal the sub-processes and mechanisms through which highly preferential crystallographic orientation of MHP films can be formed. We demonstrate methods to controllably tune the direction and degree of the preferential orientation. Impact of the degree of thin film orientation on solar cell performance will be discussed.