452910 Combined Quartz Crystal Microbalance with Dissipation and Generalized Ellipsometry to Characterize the Deposition of Titanium Dioxide Nanoparticles on Model Rough Surfaces
A new mechanical model that considers both viscoelastic and surface roughness effects  is described to analyze QCM-D measurements. Obtained parameters include adsorbate areal mass density, adsorbate viscoelastic properties, the vertical roughness length, and the permeability length. Silicon slanted columnar thin films (SCTFs) were deposited onto QCM-D sensors by electron-beam glancing angle deposition and conformably coated with an alumina film via atomic layer deposition to act as model rough surfaces. The adsorption of polyacrylate-stabilized TiO2NPs onto flat surfaces and the SCTFs was measured by QCM-D and generalized ellipsometry (GE), an optical reference technique.
We report that the surface-roughness-modified mechanical model excludes water that is retained by the SCTF surface roughness and instead considers the surface mass density of TiO2NPs and water coupled to the TiO2NPs . GE is also sensitive to the attachment of the TiO2NPs. When the results of both techniques are combined, new information, the hydration of the polyacrylate-stabilized TiO2NPs, can be evaluated.
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