Tuesday, November 10, 2015: 8:30 AM - 11:00 AM
254C (Salt Palace Convention Center)
The physical and chemical characterization of engineered particles ranging from the nanometer to the micrometer scale plays an important role in formulation, processing and quality assurance. This session will focus on recent developments in characterization techniques and methodologies. Emphasis will be placed on nanostructured engineered particle systems with several examples of the link between novel characterization techniques and novel engineered structures and properties.
Particle Production and Characterization
Stephen L. Conway Email: firstname.lastname@example.org
Pavol Rajniak Email: email@example.com
- indicates paper has an Extended Abstract file available on CD.
See more of this Group/Topical: Particle Technology Forum