398945 Characterization of Material Properties Using Multiple Wavelength Interferometry

Monday, November 17, 2014
Galleria Exhibit Hall (Hilton Atlanta)
Anna Brown, Brown University School of Engineering, Providence, RI, Akshay Kundan, Chem. and Biol. Engin, RPI, Troy, NY, Joel L. Plawsky, Chemical, Rensselaer Polytechnic Institute, Troy, NY and Peter C. Wayner Jr., The Isermann Department of Chemical and Biological Engineering, Rensselaer Polytechnic Institute, Troy, NY

In microgravity, the performance of a constrained vapor bubble heat pipe is limited by the effect of Marangoni forces. This limit can potentially be overcome by using a mixture, rather than a pure fluid, in order to create a concentration gradient which offsets the temperature gradient. However, it is difficult to fully understand this change in concentration along the length of a pipe. In this project, multiple wavelength interferometry was used to examine the thickness and composition of the liquid film in a constrained vapor bubble heat pipe. A new application of multiple wavelength interferometry to determine concentration of a fluid at any point was derived. An algorithm to apply this method and to calculate the liquid film thickness was created.

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