376605 Single-Particle ICP-MS Methods Development for Nanoparticle Characterization

Wednesday, November 19, 2014: 10:24 AM
209 (Hilton Atlanta)
Xinhua Liang1, Yongbo Dan2, Rajankumar Patel1, Honglan Shi2 and Chady Stephan3, (1)Department of Chemical and Biochemical Engineering, Missouri University of Science and Technology, Rolla, MO, (2)Department of Chemistry, Missouri University of Science and Technology, Rolla, MO, (3)PerkinElmer Inc., Shelton, CT

Metallic element based multi-element nanoparticles (MENPs) are continuously synthesized and used increasingly. Traditional methods for assessing nanoparticle (NP) concentration and size distributions include electron microscopy, chromatography, field flow fractionation, centrifugation, laser scattering, UV spectroscopy, and so on. Difficulties generally arise due to a lack of sensitivity for characterizing and quantifying NPs at environmentally relevant low concentrations and complex environmental matrices. Inductively coupled plasma-mass spectrometry (ICP-MS) is a highly sensitive and selective method for metal and semimetal elements detection and has played important roles in many research and industry fields. The objectives of this study are to develop well-characterized analytical reference standards and high-throughput sensitive methods for MENPs characterization and quantification. The reference standards were prepared by atomic layer deposition (ALD). Single particle (SP)-ICP-MS methods were developed by using a NexION 300D/350 ICP-MS system from PerkinElmer, Inc. The major advantages of this instrument are its super sensitivity, short dwell time, multi-element capability, and high-throughput. The detailed method will be presented at the conference.

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