446 Process Monitoring, Fault Detection, and Diagnosis I

Wednesday, October 31, 2012: 8:30 AM
326 (Convention Center )
Description:
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications, data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.

Sponsor:
Computers in Operations and Information Processing
Co-Sponsor(s):
Systems and Process Control (10B)

Chair:
Jie Yu
Email: jieyu@mcmaster.ca

Co-Chair:
Prashant Mhaskar
Email: mhaskar@mcmaster.ca

See more of this Group/Topical: Computing and Systems Technology Division