PAT for Crystallization Development and Manufacturing

Wednesday, October 19, 2011: 12:30 PM
202 B (Minneapolis Convention Center)

This session welcomes presentations on recent applications of Process Analytical Technologies (PAT) for development and manufacturing of crystallization processes. PAT applications may include various spectroscopy (FTIR, NIR, Raman), particle size and counting techniques (FBRM, PVM), and other on-line or in-line monitoring or sensing techniques. Novel approaches and methodologies to drive crystallization development are of particular interest.

Crystallization and Evaporation
Process Development Division (12)

Terry P. Redman

12:30 PM
(548a) Estimation and Modeling of Crystal Size and Shape Evolution Using In Situ Tools
Mo Jiang, Mark Molaro, Michael L. Rasche, Haitao Zhang, Keith Chadwick, Lifang Zhou, Minhao Wong, Zhilong Zhu, Dominique Hebrault, Des O'Grady, John Tedesco and Richard D. Braatz

1:45 PM
(548d) Experimental Investigation of Crystal Shape Evolution During Growth and Dissolution
Meenesh R. Singh, Stephan X. M. Boerrigter, Christian Borchert, Kai Sundmacher and Dorwaiswami Ramkrishna

2:10 PM
(548e) Interpretation of FBRM Data At High Crystal Density
Huayu Li, Yoshiaki Kawajiri, Martha Grover and Ronald W. Rousseau

See more of this Group/Topical: Separations Division