Session: Characterization of Engineered Particles and Nanostructured Particulate Systems (2011 Annual Meeting)

Tuesday, October 18, 2011: 8:30 AM

M100 F (Minneapolis Convention Center)

Description:

The physical and chemical characterization of engineered particles ranging from the nanometer to the micrometer scale plays an important role in formulation, processing and quality assurance. This session will focus on recent developments in characterization techniques and methodologies. Emphasis will be placed on nanostructured engineered particle systems with several examples of the link between novel characterization techniques and novel engineered structures and properties

Sponsor:

Particle Production and Characterization

Co-Sponsor(s):

Solids Flow, Handling and Processing (03C)

Chair:

Daniel Lepek
Email: lepek@cooper.edu

Co-Chair:

Stephen L. Conway
Email: stephen_conway@merck.com

- indicates paper has an Extended Abstract file available on CD.

8:30 AM

(208a) Inkjet Fabrication of Composite Particles with Solid Inclusions for Drug Delivery and Catalytic Reactions
Jiri Dohnal and Frantisek Stepanek

8:51 AM

(208b) NANO-Structered CALCIUM Silicate Hydrate PRODUCTION
Ozgul Taspinar, Tolga Nalbantoglu, Idil Ozturk and Onur Y. Ozcan

9:12 AM

(208c) Investigation of Voids In Nanostructured RDX-Based Compositions Using Ultra-Small-Angle X-Ray Scattering
Victor Stepanov

9:33 AM

(208d) Structure Determination of MFI and MWW Zeolite Nanosheets
Xueyi Zhang, Kumar Varoon, K. Andre Mkhoyan and Michael Tsapatsis

9:54 AM

(208e) Characterization of the Durability of Super-Hydrophobic Surfaces Produced by Nanoparticle Vapor Deposition
Md. A Mahmud, Jeff Chinn, Christopher B. Roberts, William R. Ashurst and Wanda Jones

10:15 AM

(208f) Raman Spectroscopy On Size Segregated Nanoparticles From a Flame Generator
Mikko Aromaa, Heikki Suhonen, Turkka Salminen, Tapio Niemi, Juha-Pekka Nikkanen, Erkki Levänen and Jyrki M. Mäkelä

10:36 AM

(208g) Particle Shape and Roughness Characterization by Focused Ion Beam Tomography for Adhesion Simulation
Dave K. Balachandran and Stephen P. Beaudoin

See more of this Group/Topical: Particle Technology Forum

<< Previous Session | Next Session >>