Using Reflection Interference Contrast Microscopy to Study Micron-Size

Monday, October 17, 2011
Exhibit Hall B (Minneapolis Convention Center)
Jose C. Contreras-Naranjo1, Maria D. King2, Yassin A. Hassan3 and Victor M. Ugaz1, (1)Artie McFerrin Department of Chemical Engineering, Texas A&M University, College Station, TX, (2)Department of Mechanical Engineering, Texas A&M University, College Station, TX, (3)Departments of Nuclear and Mechanical Engineering, Texas A&M University, College Station, TX

Reflection interference contrast microscopy (RICM) is a
microinterferometric technique that provides valuable information about
the topography of an object close to a surface down to 1 nm vertical
resolution. RICM capabilities, such as contact area and particle shape
determination that have been traditionally used in adhesion studies of
cells and lipid vesicles, are explored here to obtain an accurate
description of micron-size aerosols of different geometries deposited on
surfaces. The information obtained will be significant for particle
deposition-resuspension phenomena where particle's morphology is a key
factor in its interaction with a surface. Preliminary experiments are
performed with polystyrene beads and the effects of coatings and
particle roughness are studied using calculations from theoretical
models of RICM image formation. In addition, the scenario of droplets
deposited on surfaces is also considered, which is relevant in drug
delivery by inhalation applications.

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See more of this Session: Poster Session: Fluid Mechanics
See more of this Group/Topical: Engineering Sciences and Fundamentals