Tuesday, October 18, 2011: 1:06 PM
M100 F (Minneapolis Convention Center)
In this paper an innovative approach is proposed in order to detect and quantify the overall attributes of fine particles resulting from different processes and characterized by different particle surface characteristics. The proposed approach is based on: a 2D-fractal analysis of fine and ultrafine particles population acquired as digital images. This approach allows to perform a full measurement and control of fine particles structure and texture by evaluating statistical fractal parameters on the base of the topological assessment of the particles on a flat surface. The work was developed with the aim to develop and implement a reliable and simple tool to use for particulate products characterization and recognition able to correlate the characteristics of fine particles detected by the proposed logics and those usually extracted by using classic methods.
See more of this Session: Dynamics and Modeling of Particles, Crystals and Agglomerate Formation
See more of this Group/Topical: Particle Technology Forum
See more of this Group/Topical: Particle Technology Forum