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Process Monitoring and Fault Detection

Thursday, November 11, 2010: 8:30 AM
250 B Room (Salt Palace Convention Center)

Description:
Latest Advances in Process Monitoring and Fault Detection


Sponsor:
Systems and Process Control


Chair:
S. Joe Qin
Email: sqin@usc.edu

Co-Chair:
Vikas Shukla
Email: vikas.shukla@exxonmobil.com

- indicates paper has an Extended Abstract file available on CD.



8:30 AM
(615a) An Integrated Fault Diagnosis and Safe-Parking Framework for Fault-Tolerant Control of Nonlinear Process Systems
Miao Du and Prashant Mhaskar


8:50 AM
(615b) Moving Horizon Estimation: Efficient Methods for Fast Implementations
Rodrigo López-Negrete de la Fuente, Sachin C. Patwardhan and Lorenz T. Biegler


9:10 AM
(615c) Model-Based Fault Detection and Fault-Tolerant Control of Process Systems Using Sampled and Delayed Measurements
Yulei Sun and Nael H. El-Farra

File available
9:30 AM
(615d) Effect of Soft Sensor Dynamics On Process Monitoring
Mitchell Serpas and Juergen Hahn


9:50 AM
(615e) Multivariate Statistical Process Monitoring Based On Statistics Pattern Analysis
Qinghua He and Jin Wang


10:10 AM
(615f) Bayesian Fault Detection and Isolation: Test Results for a Simple Benchmark Problem
Kris Villez, Babji Srinivasan, Ulaganathan Nallasivam, Humberto Garcia, Raghunathan Rengaswamy, Shankar Narasimhan, Craig Rieger and Venkat Venkatasubramanian


10:30 AM
(615g) Branch and Bound Method for Fault Isolation through Missing Variable Analysis
Vinay Kariwala, Pabara-Ebiere Odiowei, Yi Cao and Tao Chen
See more of this Group/Topical: Computing and Systems Technology Division
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