Process Monitoring, Fault Detection and Diagnosis

Wednesday, November 10, 2010: 8:30 AM
250 D Room (Salt Palace Convention Center)

Description:
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications, data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.


Sponsor:
Computers in Operations and Information Processing


Chair:
Rajagopalan Srinivasan
Email: rajsrinivasan@nus.edu.sg

Co-Chair:
Leo H. Chiang
Email: HChiang@dow.com

- indicates paper has an Extended Abstract file available on CD.



8:30 AM
(421a) Bayesian Belief Networks (BBNs) for Integration of Parallel Fault Diagnosis Modules Into Supervisory Control Systems
Kris Villez, Tim Spinner, Humberto Garcia, Craig Rieger, Raghunathan Rengaswamy and Venkat Venkatasubramanian





9:50 AM
(421e) Reliability Based Sensor Network Design for Fault Diagnosis
Mani Bhushan, Sridharakumar Narasimhan and Raghunathan Rengasamy


See more of this Group/Topical: Computing and Systems Technology Division