Process Monitoring, Fault Detection and Diagnosis

Thursday, November 12, 2009: 12:30 PM
Lincoln A (Gaylord Opryland Hotel)

Description:
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications, data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.


Sponsor:
Computers in Operations and Information Processing


Chair:
Randy Esposito
Email: wresposito@nalco.com

Co-Chair:
Qinghua He
Email: qhe@tuskegee.edu


12:30 PM
(583a) Root Cause Analyis of Closed Loop Oscillatory Systems
Ulaganathan Nallasivam, Babji Srinivasan and Raghunathan Rengaswamy

1:20 PM
(583c) Semisupervised Methodology for Fault Diagnosis in Chemical Plants
Isaac Monroy Sr., Raul Benitez, Gerard Escudero and Moisès Graells

2:10 PM
(583e) On-Line Monitoring of Tubular Microreactors Using Particle Filter
Jun-ichi Kano, Osamu Tonomura, Manabu Kano and Shinji Hasebe
See more of this Group/Topical: Computing and Systems Technology Division