Process Monitoring and Fault Detection

Tuesday, November 10, 2009: 12:30 PM
Jackson B (Gaylord Opryland Hotel)

Description:
The emphasis of this session is on the theory and applications of process monitoring and fault diagnosis in both batch and continuous processes. Contributions are sought in, but not limited to, the following areas: development of novel techniques or advances in existing techniques for fault detection, identification, and diagnosis in continuous and hybrid process systems; design of process monitoring systems for flexible manufacturing plants with multiple product recipes and various operating conditions; incorporation of process knowledge into fault detection, identification, and diagnosis; model maintenance (e.g., adaptive model, model update, etc.) and data pre-processing issues (e.g., out-lier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications. Industrial contributions and real-time case studies are encouraged.


Sponsor:
Systems and Process Control


Chair:
Nael H. El-Farra
Email: nhelfarra@ucdavis.edu

Co-Chair:
Qinghua He
Email: qhe@tuskegee.edu


3:10 PM
(268i) A Bayesian Framework for Fault-Tolerant Control of Linear Systems
Kris R. E. Villez, Shankar Narasimhan and Venkat Venkatasubramanian
See more of this Group/Topical: Computing and Systems Technology Division