Wednesday, November 11, 2009: 8:30 AM
Magnolia Boardroom B (Gaylord Opryland Hotel)
Description:
This session focuses on plasma science and processing topics, including gas-phase diagnostics, plasma-surface interactions, and multiscale modeling.
Sponsor:
Electronics and Photonics
Chair:
Co-Chair:
8:30 AM
9:20 AM
(378c)
Plasma-Assisted Atomic Layer Deposition of Titanium Dioxide: Reaction Mechanism Studies Using Attenuated Total Reflection Fourier Transform Infrared Spectroscopy
9:45 AM
(378d)
Diagnostic Study of An Arc Plasma Jet Under Atmospheric Pressure and Its Applications to Materials Processing
10:10 AM
(378e)
First-Principles-Based Kinetic Modeling of Surface Growth During Plasma Deposition of Silicon Thin Films
10:35 AM
(378f)
Feature Profile Evolution: From Plasma Etching and Deposition to Surface Roughness Propagation
See more of this Group/Topical: Materials Engineering and Sciences Division