Wednesday, November 19, 2008: 8:30 AM-11:00 AM
Room 202-A (Pennsylvania Convention Center)

Computers in Operations and Information Processing (10c)

#439 - Process Monitoring and Fault Detection (10C09)
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications, data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.
Chair:Leo H. Chiang
CoChair:Qinghua (Peter) He
8:30 AMA Statistics Pattern Based Framwork for Process Monitoring
Qinghua (Peter) He, Jin Wang
8:50 AMAgent-Based Distributed Monitoring and Fault Detection
Sinem Perk, Fouad Teymour, Ali Cinar
9:10 AMReal-Time Kinetic Hard-Modelling for the Optimisation of Reaction Conditions and the Detection of Process Upset in Semi-Batch Reactors
Julien Billeter, Yorck-Michael Neuhold, Graeme D. Puxty, Konrad Hungerbühler
9:30 AMIndustrial Implementation of on-Line Multivariate Quality Control (Part III: Relationship to molecular weights)
Leo H. Chiang, Kathy Walsh, Shawn Maynard, Bart Neff, Lloyd Colegrove
9:50 AMDempster-Shafer Fusion for Collaborative Fault Detection and Identification (FDI) with Application to a Distillation Column Case Study
Kaushik Ghosh, Yew Seng Ng, Rajagopalan Srinivasan
10:10 AMFault-Detection and Isolation and Fault-Tolerant Control of Nonlinear Process Systems Using Asynchronous Measurements
Panagiotis D. Christofides, Charles McFall, James F. Davis, Ben Ohran
10:30 AMFault Tolerant Controller Design for Transport-Reaction Processes Employing Spatial Controllability
Antonios Armaou, Michael A. Demetriou

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