Wednesday, 2 November 2005: 3:15 PM-5:45 PM
302 (Cincinnati Convention Center)

Systems and Process Control (10b)

#402 - Fault Detection and Diagnosis II (10B08)
Contributions are sought in the field of process analytical technology (PAT). Both the development of new analytical technologies and their application to process modeling, monitoring, optimization, and control are of interest. All application areas are of interest including pharmaceuticals, semiconductors, nanotechnology, fuel cells, and biotechnology. All analytical technologies are of interest including near-infrared, ATR-FTIR, Raman, in-situ XRD, in-situ particle imaging, and laser-based techniques.
CoChair:Subbarao Varigonda
Chair:Annette A. Johnston
3:15 PMSelf- Constructing and Organizing Neural Network Based Fuzzy Clustering Technique and Its Application to Fault Diagnosis
Bharat Bhushan, Jose A. Romagnoli
3:35 PMFault-Tolerant Control of a Polyethylene Reactor
Adiwinata Gani, Prashant Mhaskar, Panagiotis D. Christofides
3:55 PMAn Intelligent Pca Approach for on-Line Fault Isolation
jun Liu, K.W. Lim, R. Srinivasan, X.T. Doan
4:15 PMMulti-Scale Fisher Discriminant Analysis
Rudramurty Balla, Manish Misra
4:35 PMNonlinear Diagonal Unknown Input Observers for Fault Diagnosis
Pramod Vachhani, Sridharakumar Narasimhan, Raghunathan Rengaswamy
4:55 PMMonitoring and Fault Diagnosis by Multivariate Statistical Methods in Chemical Processes
Ridvan BERBER, Levent AKCAY
5:15 PMProbabilistic Sensor Fault Detection and Identification in Distributed Parameter Systems
Swa Metta, Masoud Soroush, Nasir Mehranbod, Michael J. Piovoso, Babatunde A. Ogunnaike
Sponsor:Computing and Systems Technology Division
Cosponsors:Process Development Division

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