Wednesday, 2 November 2005: 8:00 AM-10:30 AM
302 (Cincinnati Convention Center)

Computers in Operations and Information Processing (10c)

#320 - Fault Detection and Diagnosis I (10C11)
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas:
  • Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis.
  • Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions.
  • Incorporation of process knowledge into fault detection, identification, and diagnosis.
  • Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications
  • Data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.
    • CoChair:Leo H. Chiang
    Chair:Rajagopalan Srinivasan
    8:00 AM320aIndustrial Implementation of on-Line Multivariate Quality Control
    Leo H. Chiang, Lloyd Colegrove
    8:20 AM320bMultivariate Approaches for the Diagnosis of a Batch Chemical Process
    Manuel Zarzo, Alberto Ferrer
    8:40 AM320cA Curve Fitting Method for Detecting Valve Stiction in Oscillating Control Loops
    Q. Peter He, Jin Wang, Martin Pottmann, S. Joe Qin
    9:00 AM320dOn-Line and off-Line Fault Detection and Diagnosis in Fed-Batch Fermentation
    Jon C. Gunther, Dale E. Seborg
    9:20 AM320eMonitoring and Fault Detection of Catalytic Automotive Emission Control Systems
    Kenneth R. Muske, James C. Peyton Jones, Imad H. Makki
    9:40 AM320fAugmented Dynamic Pca Approach for Online Monitoring of Multi-Stage Batch Processes
    Xuan-Tien Doan, Rajagopalan Srinivasan
    10:00 AM320gStatistical Inference Methods for Mimo Control Performance Monitoring
    Jie Yu, S. Joe Qin
    Sponsor:Computing and Systems Technology Division

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