Preliminary Program subject to change
T2004 Ethylene Plant Process Control
OverviewApplications-oriented papers pertaining to the control and optimization of olefins plants. Papers on industrial use of novel analytics, instrumentation, systems technologies, and realtime monitoring/fault detection applications are covered. The theme for the 2006 session is Assuring Full Utilization of APC (Advanced Process Control) and RTO (Real Time Optimization) Applications.
Primary SponsorTopical 2: Ethylene Producers Conference (T2)

Chair

Don Bartusiak
Applications Group Leader
Core Process Control
ExxonMobil Chemical Company
P.O. Box 4900
Houston, TX 77522-4900
Phone Number: 281-834-5229
Email: don.bartusiak@exxonmobil.com

CoChair

James Hackney
Senior Engineer
Equistar Chemicals, LP
P.O. Box 777
Channelview, TX 77530
Phone Number: 281-862-5227
Email: james.hackney@equistarchem.com
Introduction - Opening Remarks
Don Bartusiak, Core Process Control, ExxonMobil Chemical Company, P.O. Box 4900, Houston, TX 77522-4900
Advantages of "Grey Box" Multivariable Predictive Control for Ethylene Plants
Bram De Ruiter, Shell Global Solutions International BV, The Hague, Netherlands
Building an Effective Operator Interface for Complex Apc Applications
Erin S. Percell, ExxonMobil Chemical Company, 4999 Scenic Highway, Baton Rouge, LA 70805 and Louis M. Michaud, Imperial Oil, 602 S. Christina St., Sarnia, ON N7T 7M5, Canada
A New Paradigm for Process Operator Training and Guidance
James Wu1, John Mahlstadt1, Gene Thompson1, Charles Cutler2, Matthew Hetzel2 and James Bonura2, (1)Lyondell Chemical Company, 8280 Sheldon Rd., Channelview, TX 77530, (2)Cutler Technology, 70 NE Loop 410, Suite 315, San Antonio, TX 78216
Break
A Dmcplus Tale of Two C3 Splitters
Jose Basteris, Control Consulting, Inc., 16365 Park Ten Place, Suite 335, Houston, TX 77084-5063, Pieter Couwenberg, Aspen Technology, Netherlands, Hugh O'Riordan, Dow Chemical Company, Boehlen, Germany and Jose Maria Martinez, Dow Chemical Company, Taragona, Spain
Step-Test Free Apc Implementation Using Dynamic Simulation
Nicholas Alsop, Preemraff Lysekill, Lysekil, SE-453 81, Sweden and JoseMaria Ferrer, AspenTech, Barcelona, 08029, Spain
Use of External Targets to Improve Dmcplus Controller Performance and Long-Term Benefits
Sjaak Mechielsen, Dow Chemical Company, Herbert H. Dowweg 5, P.O. Box 48, Terneuzen, Netherlands, Mauro Celendano, Dow Chemical Company, Avenida San Martin 1881, Ing. White, Bahia Blanca, Argentina, Doug Amos, Aspen Technology, 2500 City West Blvd., Suite 1500, Houston, TX 77042 and Jose Basteris, Control Consulting, Inc., 16365 Park Ten Place, Suite 335, Houston, TX 77084-5063
Concluding Remarks

Topical 2: Ethylene Producers Conference