Tuesday, November 6, 2007: 3:30 PM-6:00 PM
M - Salon I (Marriott Salt Lake City-Downtown)

Computers in Operations and Information Processing (10c)

#317 - Process Monitoring and Fault Detection II (10C16)
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications Data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.
Chair:Leo H. Chiang
CoChair:Jin Wang
3:30 PMRobust Performance-Based Fault Detection, Isolation And Compensation In Uncertain Particulate Processes
Arthi Giridhar, Nael H. El-Farra
3:55 PMDiagonal Interactors And Adaptive Weighting For Mimo Control Performance Monitoring And Improvement
Jie Yu, S. Joe Qin
4:20 PMNonlinear Sensor Network Design and Upgrade for Optimal Monitoring
Miguel J. Bagajewicz, DuyQuang Nguyen
4:45 PMNonlinear Diagonal Observers for Fault Diagnosis
Sridharakumar Narasimhan, Raghunathan Rengaswamy
5:10 PMObservability Analysis Of Effective Medium Model And Its Application In Real-Time Sensing For Chemical Vapor Deposition
Rentian Xiong, Martha Gallivan
5:35 PMOptimal Sensor Location and State Estimation for Microreactors
Osamu Tonomura, Satoshi Nagahara, Manabu Kano, Shinji Hasebe

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