| Monday, November 5, 2007: 12:30 PM-3:00 PM | |||
| M - Salon D (Marriott Salt Lake City-Downtown) | |||
Solids Flow, Handling and Processing (03c) | |||
| #80 - Dynamics and Modeling of Particulate Systems II (03C01) | |||
| The session will focus on the advancement of chemical engineers ability to understand, predict, design, and thus optimize particulate systems. Advances in experimental methods, numerical simulations and granular theories have the potential to improve nucleation and aggregation/agglomeration/coalescence dynamics in particulate systems (including solid/liquid and solid/gas) and thus control size and topography (e.g., fractal dimension) of products. Increasing computational power and new numerical/analytical techniques from Applied Mechanics have allowed for increasingly complex particulate systems to be modeled and have set the stage for future work in such diverse areas as mixing/segregation, granulation, fluidization, and pneumatic conveying, to name but a few. | |||
| Chair: | James F. Gilchrist | ||
| CoChair: | German Drazer | ||
| 12:30 PM | 80a | A New Kinetic-Theory-Based Model For Granular Flows With Size And/or Density Differences Vicente Garzo, James W. Dufty, Christine M. Hrenya | |
| 12:48 PM | 80b | Shear Flow Of Assemblies Of Cohesive Granular Materials Lee R. Aarons, S. Sundaresan | |
| 1:06 PM | 80c | Constitutive Modeling of Particle-Phase Stress for Non-Spherical Particles Benjamin D. James, Jennifer S. Curtis | |
| 1:24 PM | 80d | Simulation Of Shear Cells: Quantitative Validation Of Dem Joseph J. McCarthy, C. Fred Higgs Jr., Venkat Jasti | |
| 1:42 PM | 80e | Particle Dynamics Simulations To Elucidate The Electrostatic Charging Of Granular Materials Nathan Duff, Dan Lacks | |
| 2:00 PM | 80f | An Approach For The Parallelization Of The Discrete Element Code Atul Dubey, M. Silvina Tomassone, Fernando J. Muzzio | |
| 2:18 PM | 80g | Impact Of The Time Step In Dem Simulations On Granular Mixing Properties Jocelyn Doucet, Francois Bertrand, Jamal Chaouki | |
| 2:36 PM | 80h | Van Der Waals Forces Between Micron-/nano-Scale Contaminants And Non-Homogenous/patterned Substrates- Implications In Photomask Cleaning Ravi P. Jaiswal, Stephen P. Beaudoin | |
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