| Tuesday, November 6, 2007: 8:30 AM-11:00 AM | |||
| M - Salon I (Marriott Salt Lake City-Downtown) | |||
Computers in Operations and Information Processing (10c) | |||
| #194 - Process Monitoring and Fault Detection (10C07) | |||
| The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications Data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications. | |||
| Chair: | Leo H. Chiang | ||
| CoChair: | Jin Wang | ||
| CoSponsor(s): | Systems and Process Control (10b) | ||
| 8:30 AM | 194a | Fault Detection Using Principal Component Based K-Nearest-Neighbor Rule Qinghua (Peter) He | |
| 8:55 AM | 194b | Multivariate Batch Process Monitoring Utilizing Summary Variables with An Application to Semiconductor Etch Neal B. Gallagher, Barry M. Wise, Jeremy M. Shaver, Robert T. Roginski, R. Scott Koch | |
| 9:20 AM | 194c | Batch Polymerization Monitoring Using Mewa and Mpca Carlos R. Alvarez, Mariano Asteasuain, Adriana Brandolin, Mabel C. Sanchez | |
| 9:45 AM | 194d | Multivariate Pattern Matching In Fed-Batch Cell Culture Jon C. Gunther, Jeremy S. Conner, Jeffrey Baclaski, Dale E. Seborg | |
| 10:10 AM | 194e | Wavelet-Genetic Algorithm Based Real-Time Prognosis Of Process Systems Jeremy Brewer, Mike Watson, Manish Misra | |
| 10:35 AM | 194f | Comparative Performance Analysis of Alternative Approaches for Gross Error Detection and Identification Carlos R. Alvarez, Adriana Brandolin, Mabel C. Sanchez | |
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